Reconstruct Your 2D SEM Images in 3D
Your scanning electron microscope measures and analyzes all kinds of samples in 2D: to analyze the surfaces of samples in 3D, use the system extension 3DSM. 3DSM, the computer-based application from ZEISS, provides you with topographical information by reconstructing a complete 3D model of the surface from SEM's AsB-Detector signals.
- Perform a 3D surface reconstruction of samples examined with electron microscopes equipped with an AsB or 4QBSD detector
- Upgrade your MERLIN FE-SEM with 3DSM Metrology to gain automatic measurements and documentation in compliance with ISO 25178, DIN and ASME and other standards for routine checks