Crossbeam 340 and Crossbeam 540

FIB-SEM-Microscopes Crossbeam 340 und Crossbeam 540

Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning.

Features:

  • Gain More Information in Less Time
  • Keep Full Process Control
  • Experience Maximum Flexibility

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